yieldWerx Detailed Features

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yieldWerx Detailed Features

yieldWerxis the perfect solution for Semiconductor Test Data Analysis engineers who want to monitor their semiconductor products throughout the manufacturing processes. It provides test and product engineers with the data visibility needed for yield enhancement, product characterization, and improving time in releasing the product to the production and the market.

We've worked hard to come up with a feature set that offers what test engineers ask for, and after several years of continuous enhancements, we feel strongly that we have produced the most advanced PC based Semiconductor Test Data Analysis Software available.

Here are some of the major features that yieldWerx offers

unlimited # of test parameter results
unlimited # of dies in a wafer or test parameter
Chart Area Auto Alignment
Chart Serialization
Drill down and Selection
Export Report s to Excel
Save Graphs as JPG
Multiple Legends
Multiple Title Items
Printing Support
Real-time Charting
Range Selection
Scrolling/Zooming
Smart Data Labels
View State Management
Sample Test Data with over 50 Wafers from multiple Lots, Test Programs, and Devices

Parametric Trend Chart	Report Table	Group Report By	Filter Report by	Smart Labels
Multiple Lot and Wafer Selection	- Min - Max - Mean - St. Deviation - Cp - Cpk - Yield - Pass Count - Fail Count	- Wafer - Lot	- Spec limits - Limits from STDF file - User Defined Limits - Tukey/Sigma Outlier limits	- Die Location (X,Y) - Test Result - Lot info - Wafers Info
Multiple Test Parameters
Custom Bin Coloring

Data Summary	Report Table	Group Report By
Multiple Parameter Selection	- Wafer ID - Sub Die Name - Parameter Number - Parameter Name - Parameter Unit of Measure - Min - Max - Mean - Std. Dev. - IQR - Cp - Cpk - Yield	- Wafer - Lot
Multiple Wafer Selection
Multiple Lot Selection

Wafer Map	Report Table	Sort Report By	Smart Labels
Multiple Wafer Selection	- Test Program - Lot ID - Wafer ID - Yield - Bin Count - Bin Percentage	- Bin Number - Bin Occurrence	- Die Location (X,Y) - Bin Number
Multiple Lot Selection
Partial Bin Selection
Custom Bin Coloring

Parametric Wafer Map	Report Table	Group Report By	Smart Labels
Multiple Wafer Selection	- Wafer Yield - Bin Count - Bin Percentage	- Lot - Wafer - Test Program - User Defined Wafer & Bin Groups	- Die count - Die Percentage - Lot info - Wafers Info
Custom Class Coloring

Parametric Histogram	Report Table	Group Report By	Smart Labels
Multiple Wafer Selection	- Parameter Name - Min - Max - Mean - Parametric Yield - St. Dev - Pass Count - Fail Count - Alarm Count - Test Program - Lot ID - Wafer ID - Sub Die Name	- Lot - Wafer	- Class Range Min - Class Range Max - Class Range Mean - Total Dies in Class Range
Multiple Lot Selection
Custom Bin Coloring

Parametric Failure	Group Report By	Report Table	Test Type
Multiple Lot and Wafer Selection	- Lot - Wafer	- Execution Count - Failure Count & Percentage - Alarm Count & Percentage	- Failing - Alarming
Custom Test Count Selection

Stacked Wafer Map	Report Table	Group Report By	Smart Labels
Multiple Lot and Wafer Selection	- Bin Count - Bin Percentage	- Bin Groups	- Die Location (XY) - Bin Count - Wafer Count
Custom Bin Selection

Data Extraction	Report Table
Multiple Lot and Wafer Selection	- Die Location (XY) - Hard Bin Name & Number - Soft Bin Name & Number - Parameter Values
Multiple Parameter Selection

XY Scatter	Report Table	Filter Report by	Smart Labels
Multiple Lot and Wafer Selection	- Wafer ID - Parameter Number - Parameter Name - Parameter Unit of Measure - Min - Max - Mean - Std. Dev. - Cp - Cpk - Parametric Yield - Pass Count - Fail Count - Alarm Count	- Spec limits - Limits from STDF file - User Defined Limits - Tukey/Sigma Outlier limits	- Parameter Number - Parameter Name - Parameter Unit of Measure - Die Location (XY) - Wafer ID
Multiple Parameter Selection

Box Plot	Report Table	Group Report By	Filter Report by	Smart Labels
Multiple Lot and Wafer Selection	- Wafer ID - Parameter Number - Parameter Name - Parameter Unit of Measure - Min - Max - Mean - Std. Dev. - Cp - Cpk - Parametric Yield - Median - 25th Percentile - 75th Percentile	- Lot - Wafer	- Spec limits - Limits from STDF file - User Defined Limits - Tukey/Sigma Outlier limits	- Die count - Die Percentage - Lot info - Wafers Info