Short description of project:
Texas Instruments Incorporated is the world leader in digital signal processing and analog technologies, the semiconductor engines of the Internet age, and develops real-time technologies that help people communicate. The company is driving the Internet age forward with semiconductor solutions for large markets such as wireless and broadband access, and for new emerging markets such as digital cameras and digital audio.
TI generates a lot of test and characterization data from both wafers as well as packaged units that under go testing. Even though there were already analysis tools in place in TI for analyzing production data, there was a strong need by engineers to efficiently fill in a Specification Compliance Matrix (SCM) for a product that was undergoing development, and was not running in mass production.
Product and test engineers identify root causes of the yield issues they face by browsing through lot, wafer, and die level parametric test data, capturing critical yield information. yieldWerx automatically identifies failing tests and dies, providing users with the ability to modify failure search criteria in real time. All searches can be saved and templates created for reuse with data received in the future. |
