yieldWerx provides a suite of test data acquisition, analysis and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production data, engineering data from manufacturing processes, wafer probe data , final test data as well as other external data sources, |
yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF data formats, and the ability to customize to your data formats, yieldWerx is the perfect solution for semiconductor test data analysis. .
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